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Atomic force microscopy in process engineering
introduction to AFM for improved processes and products Butterworth-Heinemann IChemE series
Bowen, W. Richard
;
Hilal, Nidal
- 1. ed. . , c 2009
Exemplar:
Zentrale:E02
a ing 377.7 m/081
RT Book, Whole T1 <Title>Atomic force microscopy in process engineering</Title> : <SubTitle>introduction to AFM for improved processes and products</SubTitle> UL https://suche.suub.uni-bremen.de/peid=B60147703&Exemplar=1&LAN=DE A1 Bowen, W. Richard A1 Hilal, Nidal NO 1. ed. PB Elsevier/Butterworth-Heinemann PP Amsterdam [u.a.] YR 2009 NO XVI, 283 S. : Ill., graph. Darst. T3 Butterworth-Heinemann IChemE series SN 9781856175173 LK http://katalog.suub.uni-bremen.de/DB=1/LNG=DU/CMD?ACT=SRCHA&IKT=8000&TRM=94410290* CN E02: a ing 377.7 m/081 SF ELIB - SuUB Bremen
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