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1 Ergebnisse
1
Wafer-level testing and test during burn-in for integrated ..
Artech House integrated microsystems series
Bahukudumbi, Sudarshan
;
Chakrabarty, Krishnendu
, 2010
Exemplar:
Zentrale:Magazinturm E02
a elt 676 ef/022
RT Book, Whole T1
Wafer-level testing and test during burn-in for integrated circuits
UL https://suche.suub.uni-bremen.de/peid=B62478947&Exemplar=1&LAN=DE A1 Bahukudumbi, Sudarshan A1 Chakrabarty, Krishnendu PB Artech House PP Boston, Mass. [u.a.] YR 2010 NO XV, 198 S ; 24 cm : Ill., graph. Darst T3 Artech House integrated microsystems series SN 1596939893 SN 9781596939899 SN 9781596939899 LK http://katalog.suub.uni-bremen.de/DB=1/LNG=DU/CMD?ACT=SRCHA&IKT=8000&TRM=1273927214* CN Magazinturm E02: a elt 676 ef/022 SF ELIB - SuUB Bremen
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