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1 Ergebnisse
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Analysis of quality-caused re-entrance electrical test syst..:
, In:
International journal of production research / Institution of Production Engineers ; American Institute of Industrial Engineers ; Society of Manufacturing Engineers
Liu, G.
;
Zhang, Z.
.. (2012) 12 - p. 3486-3497
Exemplar:
Zentrale
;
RT Journal Article T1 <Title>Analysis of quality-caused re-entrance electrical test system in semiconductor manufacturing by Markov method</Title> UL https://suche.suub.uni-bremen.de/peid=B72135425&Exemplar=1&LAN=DE A1 Liu, G. A1 Zhang, Z. A1 Jiang, Zhibin YR 2012 NO : graph. Darst. JF International journal of production research / Institution of Production Engineers ; American Institute of Industrial Engineers ; Society of Manufacturing Engineers VO 50 IS 12 SP 3486 OP 3497 LK http://katalog.suub.uni-bremen.de/DB=1/LNG=DU/CMD?ACT=SRCHA&IKT=8000&TRM=12584968* CN E02: z ing 016 jc/761 CN ZS-Lesesaal: ing 005 CN Magazin Zs: fc 7761 SF ELIB - SuUB Bremen
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