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Simulation Methodology for Analysis of Substrate Noise Impa..:

, In: Proceedings of the conference on Design, Automation and Test in Europe - Volume 1,
Soens, C. ; Plas, G. Van der ; Wambacq, P.. - p. 270-275 , 2005
Link: https://dl.acm.org/doi/10.1109/DATE.2005.268