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An Efficient Transparent Test Scheme for Embedded Word-Orie..:

, In: Proceedings of the conference on Design, Automation and Test in Europe - Volume 1,
Li, Jin-Fu ; Tseng, Tsu-Wei ; Wey, Chin-Long - p. 574-579 , 2005
Link: https://dl.acm.org/doi/10.1109/DATE.2005.56