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Framework for Fault Analysis and Test Generation in DRAMs:

, In: Proceedings of the conference on Design, Automation and Test in Europe - Volume 2,
Al-Ars, Zaid ; Hamdioui, Said ; Mueller, Georg. - p. 1020-1021 , 2005
Link: https://dl.acm.org/doi/10.1109/DATE.2005.161