I agree that this site is using cookies. You can find further informations here.
X
Merkliste 
 1 Ergebnisse 
 
1

On per-test fault diagnosis using the X-fault model:

, In: Proceedings of the 2004 IEEE/ACM International conference on Computer-aided design,
Wen, Xiaoqing ; Miyoshi, Tokiharu ; Kajihara, Seiji... - p. 633-640 , 2004
Link: https://dl.acm.org/doi/10.1109/ICCAD.2004.1382653