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Experience in critical path selection for deep sub-micron d..:

, In: Proceedings of the 2003 Asia and South Pacific Design Automation Conference,
Liou, Jing-Jia ; Wang, Li-C. ; Krstic, Angela. - p. 751-756 , 2003
Link: https://dl.acm.org/doi/10.1145/1119772.1119940