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Yield Enhancement Methodology for CMOS Standard Cells:

, In: Proceedings of the 7th International Symposium on Quality Electronic Design,
Epinat, Arnaud ; Vijayaraghavan, N. ; Sautier, Matthieu... - p. 497-502 , 2006
Link: https://dl.acm.org/doi/10.1109/ISQED.2006.147