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Worst-case analysis to obtain stable read/write DC margin o..:
, In:
Proceedings of the 2005 IEEE/ACM International conference on Computer-aided design
,
Tsukamoto, Y.
;
Nii, K.
;
Imaoka, S.
... - p. 398-405 , 2005
Link:
https://dl.acm.org/doi/10.5555/1129601.1129659
RT T1 <cTitle>Proceedings of the 2005 IEEE/ACM International conference on Computer-aided design</cTitle>: T1 <Title>Worst-case analysis to obtain stable read/write DC margin of high density 6T-SRAM-array with local Vth variability</Title> UL https://suche.suub.uni-bremen.de/peid=acm-1129659&Exemplar=1&LAN=DE A1 Tsukamoto, Y. A1 Nii, K. A1 Imaoka, S. A1 Oda, Y. A1 Ohbayashi, S. A1 Yoshizawa, T. A1 Makino, H. A1 Ishibashi, K. A1 Shinohara, H. PB IEEE Computer Society YR 2005 K1 Applied computing K1 Computer systems organization K1 Arts and humanities K1 Architecture (buildings) K1 Physical sciences and engineering K1 Engineering K1 Computer-aided design K1 Earth and atmospheric sciences K1 Dependable and fault-tolerant systems and networks K1 Networks K1 Network performance evaluation SP 398 OP 405 LK http://dx.doi.org/https://dl.acm.org/doi/10.5555/1129601.1129659 DO https://dl.acm.org/doi/10.5555/1129601.1129659 SF ELIB - SuUB Bremen
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