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1
Learning from artifacts : metadata utilization analysis:
, In:
Proceedings of the 6th ACM/IEEE-CS joint conference on Digital libraries
,
Moen, William E.
;
Miksa, Shawne D.
;
Eklund, Amy
.. - p. 270-271 , 2006
Link:
https://dl.acm.org/doi/10.1145/1141753.1141813
RT T1 <cTitle>Proceedings of the 6th ACM/IEEE-CS joint conference on Digital libraries</cTitle>: T1 <Title>Learning from artifacts : metadata utilization analysis</Title> UL https://suche.suub.uni-bremen.de/peid=acm-1141813&Exemplar=1&LAN=DE A1 Moen, William E. A1 Miksa, Shawne D. A1 Eklund, Amy A1 Polyakov, Serhiy A1 Snyder, Gregory PB ACM YR 2006 K1 MARC records K1 library cataloging K1 metadata utilization K1 Information systems K1 Information systems applications K1 Digital libraries and archives K1 Applied computing K1 Computers in other domains K1 Information storage systems K1 Record storage systems SP 270 OP 271 LK http://dx.doi.org/https://dl.acm.org/doi/10.1145/1141753.1141813 DO https://dl.acm.org/doi/10.1145/1141753.1141813 SF ELIB - SuUB Bremen
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