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Delay fault models and test generation for random logic seq..:

, In: Proceedings of the 29th ACM/IEEE Design Automation Conference,
Chakraborty, T. J. ; Agrawal, V. D. ; Bushnell, M. L. - p. 165-172 , 1992
Link: https://dl.acm.org/doi/10.5555/113938.117295