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Patterns meta-specification and cataloging : towards kno..:
, In:
Companion to the 21st ACM SIGPLAN symposium on Object-oriented programming systems, languages, and applications
,
Welicki, León
;
Manuel, Juan
;
Lovelle, Cueva
. - p. 679-680 , 2006
Link:
https://dl.acm.org/doi/10.1145/1176617.1176670
RT T1 <cTitle>Companion to the 21st ACM SIGPLAN symposium on Object-oriented programming systems, languages, and applications</cTitle>: T1 <Title>Patterns meta-specification and cataloging : towards knowledge management in software engineering</Title> UL https://suche.suub.uni-bremen.de/peid=acm-1176670&Exemplar=1&LAN=DE A1 Welicki, León A1 Manuel, Juan A1 Lovelle, Cueva A1 Aguilar, Luis Joyanes PB ACM YR 2006 K1 cataloging K1 design patterns K1 knowledge management K1 meta-specification K1 patterns K1 software engineering K1 Software and its engineering K1 Information systems K1 Information retrieval K1 Software notations and tools K1 General programming languages K1 Language types K1 Very high level languages K1 Information storage systems SP 679 OP 680 LK http://dx.doi.org/https://dl.acm.org/doi/10.1145/1176617.1176670 DO https://dl.acm.org/doi/10.1145/1176617.1176670 SF ELIB - SuUB Bremen
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