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Scan-BIST based on cluster analysis and the encoding of rep..:

Li, Lei ; Wang, Zhanglei ; Chakrabarty, Krishnendu
ACM Transactions on Design Automation of Electronic Systems (TODAES).  12 (2007)  1 - p. 1-21 , 2007
Link: https://dl.acm.org/doi/10.1145/1188275.1188279