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Performance and yield enhancement of FPGAs with within-die ..:
, In:
Proceedings of the 2007 ACM/SIGDA 15th international symposium on Field programmable gate arrays
,
Matsumoto, Yohei
;
Hioki, Masakazu
;
Kawanami, Takashi
... - p. 169-177 , 2007
Link:
https://dl.acm.org/doi/10.1145/1216919.1216948
RT T1 <cTitle>Proceedings of the 2007 ACM/SIGDA 15th international symposium on Field programmable gate arrays</cTitle>: T1 <Title>Performance and yield enhancement of FPGAs with within-die variation using multiple configurations</Title> UL https://suche.suub.uni-bremen.de/peid=acm-1216948&Exemplar=1&LAN=DE A1 Matsumoto, Yohei A1 Hioki, Masakazu A1 Kawanami, Takashi A1 Tsutsumi, Toshiyuki A1 Nakagawa, Tadashi A1 Sekigawa, Toshihiro A1 Koike, Hanpei PB ACM YR 2007 K1 FPGA K1 configuration K1 timing yield K1 within-die variation K1 Hardware K1 Electronic design automation K1 Physical design (EDA) K1 Hardware validation SP 169 OP 177 LK http://dx.doi.org/https://dl.acm.org/doi/10.1145/1216919.1216948 DO https://dl.acm.org/doi/10.1145/1216919.1216948 SF ELIB - SuUB Bremen
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