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Simultaneous reduction in test data volume and test time fo..:

, In: Proceedings of the 17th ACM Great Lakes symposium on VLSI,
Zhou, Bin ; Ye, Yi-Zheng ; Wang, Yong-Sheng - p. 49-54 , 2007
Link: https://dl.acm.org/doi/10.1145/1228784.1228802