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Exploring linear structures of critical path delay faults t..:

, In: Proceedings of the 2006 IEEE/ACM international conference on Computer-aided design,
Lu, Shun-Yen ; Hsieh, Pei-Ying ; Liou, Jing-Jia - p. 100-106 , 2006
Link: https://dl.acm.org/doi/10.1145/1233501.1233523