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Soft error reduction in combinational logic using gate resi..:

, In: Proceedings of the 2006 IEEE/ACM international conference on Computer-aided design,
Rao, Rajeev R. ; Blaauw, David ; Sylvester, Dennis - p. 502-509 , 2006
Link: https://dl.acm.org/doi/10.1145/1233501.1233603