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1 Ergebnisse
1
Evaluating static analysis defect warnings on production so..:
, In:
Proceedings of the 7th ACM SIGPLAN-SIGSOFT workshop on Program analysis for software tools and engineering
,
Ayewah, Nathaniel
;
Pugh, William
;
Morgenthaler, J. David
.. - p. 1-8 , 2007
Link:
https://dl.acm.org/doi/10.1145/1251535.1251536
RT T1
Proceedings of the 7th ACM SIGPLAN-SIGSOFT workshop on Program analysis for software tools and engineering
: T1
Evaluating static analysis defect warnings on production software
UL https://suche.suub.uni-bremen.de/peid=acm-1251536&Exemplar=1&LAN=DE A1 Ayewah, Nathaniel A1 Pugh, William A1 Morgenthaler, J. David A1 Penix, John A1 Zhou, YuQian PB ACM YR 2007 K1 FindBugs K1 Java K1 bug patterns K1 bugs K1 false positives K1 software defects K1 software quality K1 static analysis K1 Theory of computation K1 Semantics and reasoning K1 Program semantics K1 Program reasoning K1 Program analysis K1 General and reference K1 Cross-computing tools and techniques K1 Reliability K1 Software and its engineering K1 Software organization and properties K1 Extra-functional properties K1 Software reliability SP 1 OP 8 LK http://dx.doi.org/https://dl.acm.org/doi/10.1145/1251535.1251536 DO https://dl.acm.org/doi/10.1145/1251535.1251536 SF ELIB - SuUB Bremen
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