I agree that this site is using cookies. You can find further informations
here
.
X
Login
Merkliste (
0
)
Home
About us
Home About us
Our history
Profile
Press & public relations
Friends
The library in figures
Exhibitions
Projects
Training, internships, careers
Films
Services & Information
Home Services & Information
Lending and interlibrary loans
Returns and renewals
Training and library tours
My Account
Library cards
New to the library?
Download Information
Opening hours
Learning spaces
PC, WLAN, copy, scan and print
Catalogs and collections
Home Catalogs and Collections
Rare books and manuscripts
Digital collections
Subject Areas
Our sites
Home Our sites
Central Library
Law Library (Juridicum)
BB Business and Economics (BB11)
BB Physics and Electrical Engineering
TB Engineering and Social Sciences
TB Economics and Nautical Sciences
TB Music
TB Art & Design
TB Bremerhaven
Contact the library
Home Contact the library
Staff Directory
Open access & publishing
Home Open access & publishing
Reference management: Citavi & RefWorks
Publishing documents
Open Access in Bremen
zur Desktop-Version
Toggle navigation
Merkliste
1 Ergebnisse
1
Automated fault localization with statistically suspicious ..:
, In:
Proceedings of the 2007 ACM SIGPLAN/SIGBED conference on Languages, compilers, and tools for embedded systems
,
Huang, Tai-Yi
;
Chou, Pin-Chuan
;
Tsai, Cheng-Han
. - p. 11-20 , 2007
Link:
https://dl.acm.org/doi/10.1145/1254766.1254769
RT T1 <cTitle>Proceedings of the 2007 ACM SIGPLAN/SIGBED conference on Languages, compilers, and tools for embedded systems</cTitle>: T1 <Title>Automated fault localization with statistically suspicious program states</Title> UL https://suche.suub.uni-bremen.de/peid=acm-1254769&Exemplar=1&LAN=DE A1 Huang, Tai-Yi A1 Chou, Pin-Chuan A1 Tsai, Cheng-Han A1 Chen, Hsin-An PB ACM YR 2007 K1 automated debugging K1 fault localization K1 state coverage K1 Software and its engineering K1 Software creation and management K1 Software verification and validation K1 Software defect analysis K1 Software testing and debugging K1 Process validation K1 Traceability SP 11 OP 20 LK http://dx.doi.org/https://dl.acm.org/doi/10.1145/1254766.1254769 DO https://dl.acm.org/doi/10.1145/1254766.1254769 SF ELIB - SuUB Bremen
Export
RefWorks (nur Desktop-Version!)
Flow
(Zuerst in
Flow
einloggen, dann importieren)
