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SoC testing using LFSR reseeding, and scan-slice-based TAM ..:

, In: Proceedings of the conference on Design, automation and test in Europe,
Wang, Zhanglei ; Chakrabarty, Krishnendu ; Wang, Seongmoon - p. 201-206 , 2007
Link: https://dl.acm.org/doi/10.5555/1266366.1266410