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Transient fault prediction based on anomalies in processor ..:

, In: Proceedings of the conference on Design, automation and test in Europe,
Narayanasamy, Satish ; Coskun, Ayse K. ; Calder, Brad - p. 1140-1145 , 2007
Link: https://dl.acm.org/doi/10.5555/1266366.1266613