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1 Ergebnisse
1
A probabilistic testability measure for delay faults:
, In:
Proceedings of the 28th ACM/IEEE Design Automation Conference
,
Wu, Wen Ching
;
Lee, Chung Len
- p. 440-445 , 1991
Link:
https://dl.acm.org/doi/10.1145/127601.127709
RT T1
Proceedings of the 28th ACM/IEEE Design Automation Conference
: T1
A probabilistic testability measure for delay faults
UL https://suche.suub.uni-bremen.de/peid=acm-127709&Exemplar=1&LAN=DE A1 Wu, Wen Ching A1 Lee, Chung Len PB ACM YR 1991 K1 Hardware K1 Hardware test K1 Robustness K1 Hardware reliability K1 Emerging technologies K1 Very large scale integration design K1 Theory of computation K1 Models of computation SP 440 OP 445 LK http://dx.doi.org/https://dl.acm.org/doi/10.1145/127601.127709 DO https://dl.acm.org/doi/10.1145/127601.127709 SF ELIB - SuUB Bremen
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