I agree that this site is using cookies. You can find further informations here.
X
Merkliste 
 1 Ergebnisse 
 
1

Scan test planning for power reduction:

, In: Proceedings of the 44th annual Design Automation Conference,
Imhof, Michael E. ; Zoellin, Christian G. ; Wunderlich, Hans-Joachim.. - p. 521-526 , 2007
Link: https://dl.acm.org/doi/10.1145/1278480.1278614