I agree that this site is using cookies. You can find further informations
here
.
X
Login
Merkliste (
0
)
Home
About us
Home About us
Our history
Profile
Press & public relations
Friends
The library in figures
Exhibitions
Projects
Training, internships, careers
Films
Services & Information
Home Services & Information
Lending and interlibrary loans
Returns and renewals
Training and library tours
My Account
Library cards
New to the library?
Download Information
Opening hours
Learning spaces
PC, WLAN, copy, scan and print
Catalogs and collections
Home Catalogs and Collections
Rare books and manuscripts
Digital collections
Subject Areas
Our sites
Home Our sites
Central Library
Law Library (Juridicum)
BB Business and Economics (BB11)
BB Physics and Electrical Engineering
TB Engineering and Social Sciences
TB Economics and Nautical Sciences
TB Music
TB Art & Design
TB Bremerhaven
Contact the library
Home Contact the library
Staff Directory
Open access & publishing
Home Open access & publishing
Reference management: Citavi & RefWorks
Publishing documents
Open Access in Bremen
zur Desktop-Version
Toggle navigation
Merkliste
1 Ergebnisse
1
Critical-path-aware X-filling for effective IR-drop reducti..:
, In:
Proceedings of the 44th annual Design Automation Conference
,
Wen, Xiaoqing
;
Miyase, Kohei
;
Suzuki, Tatsuya
... - p. 527-532 , 2007
Link:
https://dl.acm.org/doi/10.1145/1278480.1278615
RT T1
Proceedings of the 44th annual Design Automation Conference
: T1
Critical-path-aware X-filling for effective IR-drop reduction in at-speed scan testing
UL https://suche.suub.uni-bremen.de/peid=acm-1278615&Exemplar=1&LAN=DE A1 Wen, Xiaoqing A1 Miyase, Kohei A1 Suzuki, Tatsuya A1 Kajihara, Seiji A1 Ohsumi, Yuji A1 Saluja, Kewal K. PB ACM YR 2007 K1 X-filling K1 At-speed scan testing K1 IR-drop K1 critical path K1 test generation K1 test-induced yield loss K1 Hardware K1 Robustness K1 Hardware reliability K1 Hardware test SP 527 OP 532 LK http://dx.doi.org/https://dl.acm.org/doi/10.1145/1278480.1278615 DO https://dl.acm.org/doi/10.1145/1278480.1278615 SF ELIB - SuUB Bremen
Export
RefWorks (nur Desktop-Version!)
Flow
(Zuerst in
Flow
einloggen, dann importieren)