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1 Ergebnisse
1
SOC test architecture optimization for signal integrity fau..:
, In:
Proceedings of the 44th annual Design Automation Conference
,
Xu, Qiang
;
Zhang, Yubin
;
Chakrabarty, Krishnendu
- p. 676-681 , 2007
Link:
https://dl.acm.org/doi/10.1145/1278480.1278651
RT T1 <cTitle>Proceedings of the 44th annual Design Automation Conference</cTitle>: T1 <Title>SOC test architecture optimization for signal integrity faults on core-external interconnects</Title> UL https://suche.suub.uni-bremen.de/peid=acm-1278651&Exemplar=1&LAN=DE A1 Xu, Qiang A1 Zhang, Yubin A1 Chakrabarty, Krishnendu PB ACM YR 2007 K1 interconnects K1 signal integrity K1 test architecture optimization K1 Hardware K1 Robustness K1 Hardware reliability K1 Hardware test SP 676 OP 681 LK http://dx.doi.org/https://dl.acm.org/doi/10.1145/1278480.1278651 DO https://dl.acm.org/doi/10.1145/1278480.1278651 SF ELIB - SuUB Bremen
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