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1 Ergebnisse
1
Advanced thermal sensing circuit and test techniques used i..:
, In:
Proceedings of the 2007 international symposium on Low power electronics and design
,
Duarte, David E.
;
Taylor, Greg
;
Wong, Keng L.
.. - p. 304-309 , 2007
Link:
https://dl.acm.org/doi/10.1145/1283780.1283845
RT T1
Proceedings of the 2007 international symposium on Low power electronics and design
: T1
Advanced thermal sensing circuit and test techniques used in a high performance 65nm processor
UL https://suche.suub.uni-bremen.de/peid=acm-1283845&Exemplar=1&LAN=DE A1 Duarte, David E. A1 Taylor, Greg A1 Wong, Keng L. A1 Mughal, Usman A1 Geannopoulos, George PB ACM YR 2007 K1 analog design K1 sensor calibration error K1 temperature sensing K1 thermal management K1 Hardware K1 Very large scale integration design SP 304 OP 309 LK http://dx.doi.org/https://dl.acm.org/doi/10.1145/1283780.1283845 DO https://dl.acm.org/doi/10.1145/1283780.1283845 SF ELIB - SuUB Bremen
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