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1 Ergebnisse
1
Total ionizing dose effects in switched-capacitor filters u..:
, In:
Proceedings of the 20th annual conference on Integrated circuits and systems design
,
Espinosa-Duran, John M.
;
Velasco-Medina, Jaime
;
Huertas, Gloria
. - p. 263-266 , 2007
Link:
https://dl.acm.org/doi/10.1145/1284480.1284551
RT T1
Proceedings of the 20th annual conference on Integrated circuits and systems design
: T1
Total ionizing dose effects in switched-capacitor filters using oscillation-based test
UL https://suche.suub.uni-bremen.de/peid=acm-1284551&Exemplar=1&LAN=DE A1 Espinosa-Duran, John M. A1 Velasco-Medina, Jaime A1 Huertas, Gloria A1 Huertas, Jose Luis PB ACM YR 2007 K1 design for testability K1 oscillation-based test K1 Hardware K1 Robustness K1 Hardware reliability K1 Hardware test K1 Integrated circuits SP 263 OP 266 LK http://dx.doi.org/https://dl.acm.org/doi/10.1145/1284480.1284551 DO https://dl.acm.org/doi/10.1145/1284480.1284551 SF ELIB - SuUB Bremen
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