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1 Ergebnisse
1
Scan chain clustering for test power reduction:
, In:
Proceedings of the 45th annual Design Automation Conference
,
Elm, Melanie
;
Wunderlich, Hans-Joachim
;
Imhof, Michael E.
... - p. 828-833 , 2008
Link:
https://dl.acm.org/doi/10.1145/1391469.1391680
RT T1
Proceedings of the 45th annual Design Automation Conference
: T1
Scan chain clustering for test power reduction
UL https://suche.suub.uni-bremen.de/peid=acm-1391680&Exemplar=1&LAN=DE A1 Elm, Melanie A1 Wunderlich, Hans-Joachim A1 Imhof, Michael E. A1 Zoellin, Christian G. A1 Leenstra, Jens A1 Maeding, Nicolas PB ACM YR 2008 K1 design for test K1 low power K1 scan design K1 test K1 Hardware K1 Hardware test K1 Robustness SP 828 OP 833 LK http://dx.doi.org/https://dl.acm.org/doi/10.1145/1391469.1391680 DO https://dl.acm.org/doi/10.1145/1391469.1391680 SF ELIB - SuUB Bremen
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