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1 Ergebnisse
1
DFM in practice : hit or hype?:
, In:
Proceedings of the 45th annual Design Automation Conference
,
Rey, Juan C.
;
Nagaraj, NS
;
Kahng, Andrew
... - p. 898-899 , 2008
Link:
https://dl.acm.org/doi/10.1145/1391469.1391696
RT T1
Proceedings of the 45th annual Design Automation Conference
: T1
DFM in practice : hit or hype?
UL https://suche.suub.uni-bremen.de/peid=acm-1391696&Exemplar=1&LAN=DE A1 Rey, Juan C. A1 Nagaraj, NS A1 Kahng, Andrew A1 Klass, Fabian A1 Aitken, Rob A1 Hou, Cliff A1 Capodieci, Luigi A1 Singh, Vivek PB ACM YR 2008 K1 CMP K1 DFM K1 OPC K1 critical area analysis K1 lithography K1 yield K1 Hardware K1 Electronic design automation K1 Physical design (EDA) SP 898 OP 899 LK http://dx.doi.org/https://dl.acm.org/doi/10.1145/1391469.1391696 DO https://dl.acm.org/doi/10.1145/1391469.1391696 SF ELIB - SuUB Bremen
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