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1 Ergebnisse
1
Dynamic voltage scaling of supply and body bias exploiting ..:
, In:
Proceedings of the conference on Design, automation and test in Europe
,
Hong, Sungpack
;
Yoo, Sungjoo
;
Bin, Byeong
... - p. 242-247 , 2008
Link:
https://dl.acm.org/doi/10.1145/1403375.1403433
RT T1 <cTitle>Proceedings of the conference on Design, automation and test in Europe</cTitle>: T1 <Title>Dynamic voltage scaling of supply and body bias exploiting software runtime distribution</Title> UL https://suche.suub.uni-bremen.de/peid=acm-1403433&Exemplar=1&LAN=DE A1 Hong, Sungpack A1 Yoo, Sungjoo A1 Bin, Byeong A1 Choi, Kyu-Myung A1 Eo, Soo-Kwan A1 Kim, Taehwan PB ACM YR 2008 K1 Hardware K1 Integrated circuits K1 Digital switches K1 Logic families K1 Hardware validation K1 Computing methodologies K1 Modeling and simulation K1 Model development and analysis K1 Modeling methodologies K1 Mathematics of computing K1 Mathematical analysis K1 Numerical analysis SP 242 OP 247 LK http://dx.doi.org/https://dl.acm.org/doi/10.1145/1403375.1403433 DO https://dl.acm.org/doi/10.1145/1403375.1403433 SF ELIB - SuUB Bremen
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