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Effective IR-drop reduction in at-speed scan testing using ..:

, In: Proceedings of the 2008 IEEE/ACM International Conference on Computer-Aided Design,
Miyase, Kohei ; Noda, Kenji ; Ito, Hideaki... - p. 52-58 , 2008
Link: https://dl.acm.org/doi/10.5555/1509456.1509480