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Thermally-induced soft errors in nanoscale CMOS circuits:

, In: Proceedings of the 2007 IEEE International Symposium on Nanoscale Architectures,
Li, H. ; Mundy, J. ; Patterson, W.... - p. 62-69 , 2007
Link: https://dl.acm.org/doi/10.1109/NANOARCH.2007.4400859