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Reliability aware yield improvement technique for nanotechn..:

, In: Proceedings of the 22nd Annual Symposium on Integrated Circuits and System Design: Chip on the Dunes,
Argyrides, C. ; Dimosthenous, G. ; Pradhan, D. K... - p. 1-6 , 2009
Link: https://dl.acm.org/doi/10.1145/1601896.1601958