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1 Ergebnisse
1
Fault models for embedded-DRAM macros:
, In:
Proceedings of the 46th Annual Design Automation Conference
,
Chao, Mango C.-T.
;
Yang, Hao-Yu
;
Huang, Rei-Fu
.. - p. 714-719 , 2009
Link:
https://dl.acm.org/doi/10.1145/1629911.1630097
RT T1 <cTitle>Proceedings of the 46th Annual Design Automation Conference</cTitle>: T1 <Title>Fault models for embedded-DRAM macros</Title> UL https://suche.suub.uni-bremen.de/peid=acm-1630097&Exemplar=1&LAN=DE A1 Chao, Mango C.-T. A1 Yang, Hao-Yu A1 Huang, Rei-Fu A1 Lin, Shih-Chin A1 Chin, Ching-Yu PB ACM YR 2009 K1 embedded DRAM K1 memory testing K1 Hardware K1 Hardware test K1 Robustness SP 714 OP 719 LK http://dx.doi.org/https://dl.acm.org/doi/10.1145/1629911.1630097 DO https://dl.acm.org/doi/10.1145/1629911.1630097 SF ELIB - SuUB Bremen
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