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1 Ergebnisse
1
Pattern grading for testing critical paths considering powe..:
, In:
Proceedings of the 20th symposium on Great lakes symposium on VLSI
,
Ma, Junxia
;
Lee, Jeremy
;
Tehranipoor, Mohammad
.. - p. 127-130 , 2010
Link:
https://dl.acm.org/doi/10.1145/1785481.1785512
RT T1 <cTitle>Proceedings of the 20th symposium on Great lakes symposium on VLSI</cTitle>: T1 <Title>Pattern grading for testing critical paths considering power supply noise and crosstalk using a layout-aware quality metric</Title> UL https://suche.suub.uni-bremen.de/peid=acm-1785512&Exemplar=1&LAN=DE A1 Ma, Junxia A1 Lee, Jeremy A1 Tehranipoor, Mohammad A1 Ahmed, Nisar A1 Girard, Patrick PB ACM YR 2010 K1 crosstalk K1 path delay test K1 pattern grading K1 power supply noise K1 signal integrity K1 Hardware K1 Hardware test K1 Test-pattern generation and fault simulation K1 Applied computing K1 Arts and humanities K1 Architecture (buildings) K1 Computer-aided design K1 Physical sciences and engineering K1 Engineering SP 127 OP 130 LK http://dx.doi.org/https://dl.acm.org/doi/10.1145/1785481.1785512 DO https://dl.acm.org/doi/10.1145/1785481.1785512 SF ELIB - SuUB Bremen
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