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1 Ergebnisse
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In-situ characterization and extraction of SRAM variability:
, In:
Proceedings of the 47th Design Automation Conference
,
Chellappa, Srivatsan
;
Ni, Jia
;
Yao, Xiaoyin
... - p. 711-716 , 2010
Link:
https://dl.acm.org/doi/10.1145/1837274.1837454
RT T1 <cTitle>Proceedings of the 47th Design Automation Conference</cTitle>: T1 <Title>In-situ characterization and extraction of SRAM variability</Title> UL https://suche.suub.uni-bremen.de/peid=acm-1837454&Exemplar=1&LAN=DE A1 Chellappa, Srivatsan A1 Ni, Jia A1 Yao, Xiaoyin A1 Hindman, Nathan A1 Velamala, Jyothi A1 Chen, Min A1 Cao, Yu A1 Clark, Lawrence T. PB ACM YR 2010 K1 SRAM test K1 data retention voltage K1 extraction K1 threshold voltage variation K1 write margin K1 Hardware K1 Electronic design automation K1 Physical design (EDA) K1 Hardware validation SP 711 OP 716 LK http://dx.doi.org/https://dl.acm.org/doi/10.1145/1837274.1837454 DO https://dl.acm.org/doi/10.1145/1837274.1837454 SF ELIB - SuUB Bremen
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