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Impact analysis of SCRs using single and multi-label machin..:
, In:
Proceedings of the 2010 ACM-IEEE International Symposium on Empirical Software Engineering and Measurement
,
Ahsan, Syed Nadeem
;
Wotawa, Franz
- p. 1-4 , 2010
Link:
https://dl.acm.org/doi/10.1145/1852786.1852851
RT T1 <cTitle>Proceedings of the 2010 ACM-IEEE International Symposium on Empirical Software Engineering and Measurement</cTitle>: T1 <Title>Impact analysis of SCRs using single and multi-label machine learning classification</Title> UL https://suche.suub.uni-bremen.de/peid=acm-1852851&Exemplar=1&LAN=DE A1 Ahsan, Syed Nadeem A1 Wotawa, Franz PB ACM YR 2010 K1 bug reports K1 impact analysis K1 multi-label classification K1 Information systems K1 Information storage systems K1 Record storage systems K1 Software and its engineering K1 Software creation and management K1 Software post-development issues K1 Social and professional topics K1 Professional topics K1 Management of computing and information systems K1 Software management K1 Software maintenance SP 1 OP 4 LK http://dx.doi.org/https://dl.acm.org/doi/10.1145/1852786.1852851 DO https://dl.acm.org/doi/10.1145/1852786.1852851 SF ELIB - SuUB Bremen
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