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1 Ergebnisse
1
On evaluating the signal reliability of self-checking arith..:
, In:
Proceedings of the 23rd symposium on Integrated circuits and system design
,
Franco, Denis Teixeira
;
Vasconcelos, Maí Correa
;
Naviner, Lirida Barros
. - p. 109-114 , 2010
Link:
https://dl.acm.org/doi/10.1145/1854153.1854182
RT T1
Proceedings of the 23rd symposium on Integrated circuits and system design
: T1
On evaluating the signal reliability of self-checking arithmetic circuits
UL https://suche.suub.uni-bremen.de/peid=acm-1854182&Exemplar=1&LAN=DE A1 Franco, Denis Teixeira A1 Vasconcelos, Maí Correa A1 Naviner, Lirida Barros A1 Naviner, Jean-François PB ACM YR 2010 K1 CED K1 MTBF K1 TMR K1 fault masking K1 fault tolerance K1 Hardware K1 Hardware test K1 Robustness SP 109 OP 114 LK http://dx.doi.org/https://dl.acm.org/doi/10.1145/1854153.1854182 DO https://dl.acm.org/doi/10.1145/1854153.1854182 SF ELIB - SuUB Bremen
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