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1 Ergebnisse
1
Exploiting count spectra for Bayesian fault localization:
, In:
Proceedings of the 6th International Conference on Predictive Models in Software Engineering
,
Abreu, Rui
;
Gonzalez-Sanchez, Alberto
;
van Gemund, Arjan J. C.
- p. 1-10 , 2010
Link:
https://dl.acm.org/doi/10.1145/1868328.1868347
RT T1
Proceedings of the 6th International Conference on Predictive Models in Software Engineering
: T1
Exploiting count spectra for Bayesian fault localization
UL https://suche.suub.uni-bremen.de/peid=acm-1868347&Exemplar=1&LAN=DE A1 Abreu, Rui A1 Gonzalez-Sanchez, Alberto A1 van Gemund, Arjan J. C. PB ACM YR 2010 K1 component count spectra K1 debugging K1 reasoning approach K1 Software and its engineering K1 Software creation and management K1 Software verification and validation K1 Software defect analysis K1 Software testing and debugging SP 1 OP 10 LK http://dx.doi.org/https://dl.acm.org/doi/10.1145/1868328.1868347 DO https://dl.acm.org/doi/10.1145/1868328.1868347 SF ELIB - SuUB Bremen
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