I agree that this site is using cookies. You can find further informations here.
X
Merkliste 
 1 Ergebnisse 
 
1

Exploiting count spectra for Bayesian fault localization:

, In: Proceedings of the 6th International Conference on Predictive Models in Software Engineering,
Abreu, Rui ; Gonzalez-Sanchez, Alberto ; van Gemund, Arjan J. C. - p. 1-10 , 2010
Link: https://dl.acm.org/doi/10.1145/1868328.1868347