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1 Ergebnisse
1
Analog circuit test based on a digital signature:
, In:
Proceedings of the Conference on Design, Automation and Test in Europe
,
Gómez, A.
;
Sanahuja, R.
;
Balado, L.
. - p. 1641-1644 , 2010
Link:
https://dl.acm.org/doi/10.5555/1870926.1871322
RT T1
Proceedings of the Conference on Design, Automation and Test in Europe
: T1
Analog circuit test based on a digital signature
UL https://suche.suub.uni-bremen.de/peid=acm-1871322&Exemplar=1&LAN=DE A1 Gómez, A. A1 Sanahuja, R. A1 Balado, L. A1 Figueras, J. PB European Design and Automation Association YR 2010 K1 mixed-signal test K1 monitoring K1 nonlinear zone boundary K1 specification verification SP 1641 OP 1644 LK http://dx.doi.org/https://dl.acm.org/doi/10.5555/1870926.1871322 DO https://dl.acm.org/doi/10.5555/1870926.1871322 SF ELIB - SuUB Bremen
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