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1 Ergebnisse
1
An event-guided approach to reducing voltage noise in proce..:
, In:
Proceedings of the Conference on Design, Automation and Test in Europe
,
Gupta, Meeta S.
;
Reddi, Vijay Janapa
;
Holloway, Glenn
.. - p. 160-165 , 2009
Link:
https://dl.acm.org/doi/10.5555/1874620.1874659
RT T1 <cTitle>Proceedings of the Conference on Design, Automation and Test in Europe</cTitle>: T1 <Title>An event-guided approach to reducing voltage noise in processors</Title> UL https://suche.suub.uni-bremen.de/peid=acm-1874659&Exemplar=1&LAN=DE A1 Gupta, Meeta S. A1 Reddi, Vijay Janapa A1 Holloway, Glenn A1 Wei, Gu-Yeon A1 Brooks, David M. PB European Design and Automation Association YR 2009 K1 Computer systems organization K1 Dependable and fault-tolerant systems and networks K1 Hardware K1 Hardware validation K1 General and reference K1 Cross-computing tools and techniques K1 Performance K1 Social and professional topics K1 Professional topics K1 Computing profession K1 Testing, certification and licensing SP 160 OP 165 LK http://dx.doi.org/https://dl.acm.org/doi/10.5555/1874620.1874659 DO https://dl.acm.org/doi/10.5555/1874620.1874659 SF ELIB - SuUB Bremen
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