I agree that this site is using cookies. You can find further informations here.
X
Merkliste 
 1 Ergebnisse 
 
1

Cross-coupling in 65nm fully integrated EDGE system on chip..:

, In: Proceedings of the Conference on Design, Automation and Test in Europe,
Bonnaud, Pierre-Henri ; Sommer, Grit - p. 1045-1050 , 2009
Link: https://dl.acm.org/doi/10.5555/1874620.1874874