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1 Ergebnisse
1
Cross-coupling in 65nm fully integrated EDGE system on chip..:
, In:
Proceedings of the Conference on Design, Automation and Test in Europe
,
Bonnaud, Pierre-Henri
;
Sommer, Grit
- p. 1045-1050 , 2009
Link:
https://dl.acm.org/doi/10.5555/1874620.1874874
RT T1
Proceedings of the Conference on Design, Automation and Test in Europe
: T1
Cross-coupling in 65nm fully integrated EDGE system on chip : design and cross-coupling prevention of complex 65nm SoC
UL https://suche.suub.uni-bremen.de/peid=acm-1874874&Exemplar=1&LAN=DE A1 Bonnaud, Pierre-Henri A1 Sommer, Grit PB European Design and Automation Association YR 2009 K1 SoC integration K1 aggressors K1 chip & package co-design K1 cross-coupling K1 eWLB K1 victims K1 Hardware K1 Very large scale integration design K1 Hardware validation K1 Emerging technologies K1 Electronic design automation K1 Physical design (EDA) SP 1045 OP 1050 LK http://dx.doi.org/https://dl.acm.org/doi/10.5555/1874620.1874874 DO https://dl.acm.org/doi/10.5555/1874620.1874874 SF ELIB - SuUB Bremen
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