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A new design-for-test technique for SRAM core-cell stabilit..:

, In: Proceedings of the Conference on Design, Automation and Test in Europe,
Ney, A. ; Dilillo, L. ; Girard, P.... - p. 1344-1348 , 2009
Link: https://dl.acm.org/doi/10.5555/1874620.1874944