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1 Ergebnisse
1
Resilient design in scaled CMOS for energy efficiency:
, In:
Proceedings of the 2010 Asia and South Pacific Design Automation Conference
,
Tschanz, James
;
Bowman, Keith
;
Khellah, Muhammad
... - p. 625 ff. , 2010
Link:
https://dl.acm.org/doi/10.5555/1899721.1899868
RT T1
Proceedings of the 2010 Asia and South Pacific Design Automation Conference
: T1
Resilient design in scaled CMOS for energy efficiency
UL https://suche.suub.uni-bremen.de/peid=acm-1899868&Exemplar=1&LAN=DE A1 Tschanz, James A1 Bowman, Keith A1 Khellah, Muhammad A1 Wilkerson, Chris A1 Geuskens, Bibiche A1 Somasekhar, Dinesh A1 Raychowdhury, Arijit A1 Kulkarni, Jaydeep A1 Tokunaga, Carlos A1 Lu, Shih-Lien A1 Karnik, Tanay A1 De, Vivek PB IEEE Press YR 2010 K1 Hardware K1 Very large scale integration design K1 Hardware validation K1 Hardware test K1 Robustness SP 625 ff. LK http://dx.doi.org/https://dl.acm.org/doi/10.5555/1899721.1899868 DO https://dl.acm.org/doi/10.5555/1899721.1899868 SF ELIB - SuUB Bremen
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