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Automatic test program generation for pipelined processors:

, In: Proceedings of the 1994 IEEE/ACM international conference on Computer-aided design,
Iwashita, Hiroaki ; Kowatari, Satoshi ; Nakata, Tsuneo. - p. 580-583 , 1994
Link: https://dl.acm.org/doi/10.5555/191326.191566