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Equivalent lumped element models for various n-port through..:
, In:
Proceedings of the 16th Asia and South Pacific Design Automation Conference
,
Salah, Khaled
;
Ragai, Hani
;
Ismail, Yehea
. - p. 176-183 , 2011
Link:
https://dl.acm.org/doi/10.5555/1950815.1950862
RT T1
Proceedings of the 16th Asia and South Pacific Design Automation Conference
: T1
Equivalent lumped element models for various n-port through silicon vias networks
UL https://suche.suub.uni-bremen.de/peid=acm-1950862&Exemplar=1&LAN=DE A1 Salah, Khaled A1 Ragai, Hani A1 Ismail, Yehea A1 Rouby, Alaa El PB IEEE Press YR 2011 K1 TSV K1 dimensional analysis K1 modeling K1 three-dimensional iCs K1 through silicon via K1 Hardware K1 Electronic design automation K1 Physical design (EDA) K1 Hardware test K1 Robustness K1 Hardware validation SP 176 OP 183 LK http://dx.doi.org/https://dl.acm.org/doi/10.5555/1950815.1950862 DO https://dl.acm.org/doi/10.5555/1950815.1950862 SF ELIB - SuUB Bremen
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