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1 Ergebnisse
1
On testing wave pipelined circuits:
, In:
Proceedings of the 31st annual Design Automation Conference
,
Shyur, Jui-Ching
;
Chen, Hung-Pin
;
Parng, Tai-Ming
- p. 370-374 , 1994
Link:
https://dl.acm.org/doi/10.1145/196244.196425
RT T1 <cTitle>Proceedings of the 31st annual Design Automation Conference</cTitle>: T1 <Title>On testing wave pipelined circuits</Title> UL https://suche.suub.uni-bremen.de/peid=acm-196425&Exemplar=1&LAN=DE A1 Shyur, Jui-Ching A1 Chen, Hung-Pin A1 Parng, Tai-Ming PB ACM YR 1994 K1 Hardware K1 Integrated circuits K1 Logic circuits K1 Combinational circuits K1 Hardware test K1 Design for testability SP 370 OP 374 LK http://dx.doi.org/https://dl.acm.org/doi/10.1145/196244.196425 DO https://dl.acm.org/doi/10.1145/196244.196425 SF ELIB - SuUB Bremen
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