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Nanometer-scale standard cell library for enhanced redundan..:

, In: Proceedings of the 21st edition of the great lakes symposium on Great lakes symposium on VLSI,
Kan, Tsang-Chi ; Yang, Shih-Hsien ; Chang, Ting-Feng. - p. 319-324 , 2011
Link: https://dl.acm.org/doi/10.1145/1973009.1973073