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1 Ergebnisse
1
Test pattern generation hardware motivated by pseudo-exhaus..:
, In:
Proceedings of the conference on European design automation
,
Kunzmann, Arno B.
- p. 240-245 , 1994
Link:
https://dl.acm.org/doi/10.5555/198174.198252
RT T1 <cTitle>Proceedings of the conference on European design automation</cTitle>: T1 <Title>Test pattern generation hardware motivated by pseudo-exhaustive test techniques</Title> UL https://suche.suub.uni-bremen.de/peid=acm-198252&Exemplar=1&LAN=DE A1 Kunzmann, Arno B. PB IEEE Computer Society Press YR 1994 K1 Hardware K1 Very large scale integration design K1 Hardware test K1 Test-pattern generation and fault simulation SP 240 OP 245 LK http://dx.doi.org/https://dl.acm.org/doi/10.5555/198174.198252 DO https://dl.acm.org/doi/10.5555/198174.198252 SF ELIB - SuUB Bremen
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